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Produção Científica e Tecnológica

  • "An X-Ray Microdensitometer", L.P. Cardoso and S. Caticha-Ellis, J. Phys. E (Scient. Instrum.) (1979) 12, 545(atualmente Rev. Sci. Instrum.)
  • "X-Ray Interference by Division of Wave-Front: A New X-Ray Interferometer", S.L. Chang and C. Campos , Appl. Phys. Lett., 40(7), 558-559 (1982)
  • "A Simple Method to Cut a single crystal in any desired direction",C. Campos, L. P. Cardoso and S. Caticha-Ellis, J.Appl. Cryst. (1983) 116, 360
  • "Investigations on Anisotropic Surface Roughness of Thin Films using X-Ray Specular Reflection Topography", S.L. Chang, L.P. Cardoso and S. Moehlecke, J. Crystal Growth (1985) 73, 43-46
  • "Experimental Observation of The Borrmann Prism: The Borrmann Fan for a Four-Beam Transmission of X-Rays", C. Campos and S.L. Chang , Acta Cryst., A42, 348-352 (1986)
  • "Synchrotron X-Ray Powder Diffraction at X13-A: A Dedicated Powder Diffractometer at the National Synchrotron Light Source", D.E. Cox, J.B. Hastings, L. P. Cardoso and L.W. Finger, Mat.Sci. Forum (1986) 9,1-20
  • "Structural Studies of LiVO2in the Temperature range 20-300oC", L.P. Cardoso, D.E. Cox, T.A. Hewston and B.L. Chamberland, J.Solid State Chem.(1988) 72, 234-243
  • "Experimental Facilities for High Resolution X-Ray Multiple Diffraction Studies Using the Daresbury Synchrotron Radiation Source", C. Campos, G.F. Clark, E. Pantos, K.J. Roberts and J.M. Sasaki, Conference Procedings 2nd European Conference on Progress in X-Ray Synchrotron Radiation Source, SIF, Editrice Compositori Bologna, vol. 25, 425-428 (1989)
  • "Characterization of AuGeNi Ohmic Contacts on n-GaAs using Electrical measurements, Auger Spectroscopy and X-Ray Diffractometry", J.B.B.de Oliveira, C.A. Olivieri, J.C. Galzerani, A.A.Pasa, L. P. Cardoso and F.C. de Prince, Vacuum (1990) 41, 807-810
  • "Preparation and Characterization of n-GaAs/AuGeNi Ohmic Contacts", J.B.B. Oliveira, L. P. Cardoso, F.C. Prince, A.A. Pasa, C.A. Olivieri and J.C. Galzerani, Semiconductor Physics-4th Brazilian School of Semiconductor Physics, Brazil, World Scientific Int. Pub.(1990), 443-446
  • "Characterization of the InGaAsP/GaAs Interface by X-Ray Multiple Diffraction", S.L.Morelhão, L. P. Cardoso, J.M. Sasaki and A.C. Sachs, Defect Control in Semiconductors, ed. K.Sumino, North Holland (1990), 1117-1121
  • "Multiple Diffraction Simulation in the Study of Epitaxial Layers", C.A.B.Salles da Costa, L. P. Cardoso, V.L.Mazzocchi and C.B.R. Parente, Defect Control in Semiconductors, ed. K.Sumino, North Holland (1990), 1535-1539
  • "Simulation of Hybrid Reflections in the X-Ray Multiple Diffraction Experiments", S.L. Morelhão and L. P. Cardoso, J. Crystal Growth (1991) 110, 543-552
  • "Composition Fluctuation on the Growth of GaAlAs/GaAs and GaInAs/InP Structures by AP-MOVPE", P.Ossart, Maria J.S.P. Brasil, L. P. Cardoso, J.D. Garniere, L.Horiuchi, J.Decobert and M.A. Sacilotti, Jpn. J. Appl. Phys. (Lett.) (1991) 30(5A), L783- L785
  • "Hybrid Multiple Diffraction in Renninger Scan for Heteroepitaxial Layers", S.L. Morelhão, L. P. Cardoso, J.M. Sasaki and M.M.G. de Carvalho, J. Appl. Phys. (1991) 70 (5), 2589-2593
  • "High Resolution Renninger Scan Obtained on InGaAs/AlGaInAs/InP Layered Material with Synchrotron Radiation", J.M. Sasaki, L. P. Cardoso,C. Campos,K.J. Roberts,,G.F. Clark, E. Pantos, J.Decobert and M.A. Sacilotti, Semiconductor Physics, Ed. J.R.Leite, A. Fazzio, A.S. Chaves, World Scient.(1991) 262-266
  • "High Resolution X-Ray Diffraction in the Study of AlGaInAs Layers", J.M.Sasaki, L. P. Cardoso, T.W. Ryan, J. Decobert and M.A. Sacilotti, Semiconductor Physics, Ed. J.R.Leite, A. Fazzio, A.S.Chaves, World Scient.(1991) 257-261
  • "AuZn Ohmic Contacts to p-GaSb: Electrical and Structural Properties of the Interface", A.M. Oyama, R. Oliveira, P.S. Pizani, J.C. Galzerani, L. P. Cardoso, S.L.Morelhão and R. Landers, Semiconductor Physics, Ed.J.R.Leite, A. Fazzio, A.S.Chaves, World Scient.(1991) 385-389
  • "Sistema Automatizado para Difração Múltipla com Feixe de Raios-X de Baixa Divergência", J.M. Sasaki, A.P. Pereira, S.L. Morelhão, C.E.M. de Oliveira and L.P. Cardoso, Rev. Fís. Apl. e Instrum. (1991) 6(2), 78-95
  • "Growth and Characterization of GaAlAs/GaAs and GaInAs/InP Structures: The ffect of a pulse metalorganic flow", M.A. Sacilotti, L. Horiuchi, J. Decobert, M.J. Brasil, L. P. Cardoso, P. Ossart J.D. Garnière, J. Appl. Phys. (1992)71 (1), 179-186
  • "Simulation of Renninger Scans for Heteroepitaxial Structures", C.A.B. Salles da Costa, L. P. Cardoso, V.L. Mazzocchi and C.B.R. Parente, J. Appl. Crystallogr. (1992) 25, 366-371
  • "Mosaic Spread of the Heteroepitaxial Structures from Renninger Scan", S.L. Morelhão and L. P. Cardoso, Mat. Res. Soc. Symp. Proc.(1992) vol.262, 175-180
  • "The Sensitivity of Renninger Scan Intensities with Al Content in Ga(1-x)Al(x)As/GaAs Samples", J.M. Sasaki, C. Campos and L. P. Cardoso, Mat. Res. Soc. Symp. Proc.(1992) vol.262, 269-273
  • "Growth and Characterization of type-II/type-I AlGaInAs/InP Interfaces", M. Sacilotti, P. Motisuke, Y. Monteil, P. Abraham, F.Iikawa, C. Montes,M. Furtado, L. Horiuchi, R. Landers, J. Morais, L. Cardoso, J. Decobert and B. Waldman, J. Crystal Growth (1992) 124, 589-595
  • "Structural Properties of Heteroepitaxial Systems Using Hybrid Multiple Diffraction in Renninger Scans", S.L. Morelhão and L. P. Cardoso, J. Appl. Phys. (1993), 73(9), 4218-4226
  • "The Au and Au-Zn Contacts on p-GaSb and the Characteristics of the Interfaces", J.C. Galzerani, A.M. Oyama, P.S. Pizani, R. Landers, S.L. Morelhão and L. P. Cardoso, Mat.Sci. Eng. (1993) B20, 328-331
  • "Phase Relations and Magnetic Properties of Co-rich Alloys of the U-Co System", S. Gama, E.H.C.P. Sinnecker, C.A. Ribeiro, L. P. Cardoso and M. Torikachvili, IEEE Trans. on Magn. (1993) 29(6), 2884-2886
  • "Analysis of Interfacial Misfit Dislocation by X-Ray Multiple Diffraction", S.L. Morelhão and L. P. Cardoso, Solid State Comm. (1993) 88(6), 465-469
  • "Mechanical Properties of the GaAs/Si(001) Interface by X-Rays Hybrid Multiple Diffraction", S.L. Morelhão, L. P. Cardoso and M.M.G. de Carvalho, Mat. Res. Soc. Symp. Proc. (1993) vol. 308, 439-444
  • "A Detailed Study in the Nitride Precipitates of the Nd2Fe17Nx Compound", C.C. Colucci, S. Gama, C.A. Ribeiro andL. P. Cardoso, J. Appl. Phys. (1994) 75(10) 6003-6005
  • "Crystallization Process and Chemical Disorder in Flash Evaporated Amorphous Gallium Antimonide", J.H. Dias da Silva, J.I. Cisneros and L. P. Cardoso, Mat. Res. Soc. Symp. Proc. (1994) vol. 321, 645-650
  • "Crystalline Perfection of Semiconductor Surfaces by X-Ray Multiple Diffraction", S.L. Morelhão, L.H. Avanci and L. P. Cardoso, Mat. Res. Soc. Symp. Proc. (1995) vol. 355, 215-220
  • "Direct Observation in w :f scans of the strain effect produced by the growth of InP layers on GaAs(100) substrates"(portuguese), L.H. Avanci, S.L. Morelhão, L. P. Cardoso, Ferenc Riesz, K. Rakennus and T. Hakkarainen, Pesq. Desenv. tecn. (1995) 19, 46-48
  • "X-ray Diffraction in the study of implanted semiconductor strain profiles"(portuguese). M.A. Hayashi, C. Campos, L. P. Cardoso, J.M. Sasaki and L.C. Kretly, Pesq. Desenv. tecn. (1995) 19, 49-50
  • "A Detailed Study of the Nitrogenation of the Fe17RPhases (R=Sm,Gd,Ho and Tb)", S. Gama, C.A. Ribeiro, C.C. Colucci, N.L. Sanjurjo, C. Campos, IEEE, Tans. Magn, 31 (6), 3704-3706 (1995)
  • "Oxigen Absortion by the Fe17Sm2 Phase", S. Gama, C.C. Colucci, C.A. Ribeiro, N. L. Sanjurjo, C. Campos, E. de Morais, IEEE, Tans. Magn., 31(6) 3719-3721 (1995)
  • "Structural Studies on InP/GaAs Heterostructures using multiple X-Ray Diffraction", S.L. Morelhão, L.H. Avanci, L. P. Cardoso, F.Riesz, K. Rakennus and T. Hakkarainen, Vacuum (1995) 46(9/10), 1013-1015
  • "Plasma surface treatment of AISI 4140 steel for improved corrosion resistance", F.G. Mittelstadt, C.V. Franco, J. Muzart, A.R. de Souza and L. P. Cardoso, J. Mater. Sci. (1995) 31, 431-435
  • "X-Ray study of the Fe-Nb system", J.M. Zelaya-Bejarano, N.L. Sanjurjo, C.A Ribeiro and C. Campos, Rev. Bras. de Fís. Aplicada e Instrumentação, 11, 156 (1996)
  • "Caracterization of Fe17R2 Phases (R= Pr and Sm)", S. Gama, C.A. Ribeiro, F.A.O. Cabral, C.C. Colucci, E. de Morais, N.L. Sanjurjo, C. Campos, J.D. Ardirsson and A.I.C. Persiano, J. Appl. Phys. 79 (8) 5973-5975 (1996)
  • "X-ray Multiple Diffraction in Renninger Scanning Mode: Simulation of Data Recorded using Synchrotron Radiation", J.M. Sasaki, L. P. Cardoso, C. Campos, K.J. Roberts, G.F. Clark, E. Pantos and M.A. Sacilotti, J. Appl. Cryst. (1996) 29, 325-330
  • "Using Synchrotron Radiation X-Ray Multiple Diffraction to Examine the lattice coherency of an InGaAs/AlGaInAs layer grown on InP", J.M. Sasaki, L. P. Cardoso, C. Campos, K.J. Roberts, G.F. Clark, E. Pantos, J. Decobert and M.A. Sacilotti, J. Appl. Phys. (1996) 79(7), 3492-3498
  • "Characterization of PbTe Epitaxial Layers Grown on BaF2/CaF2/Si Structures", C. Boschetti., E. Abramof, P.H.O. Rappl, I.N. Bandeira, P Motisuke, M.A. Hayashi and L. P. Cardoso, Brazilian J. of Phys. (1996) 26(1), 406-409
  • "X-Ray Multiple Diffraction Phenomenon in the Evaluation of Semiconductor Crystalline Perfection", S.L. Morelhão andL. P. Cardoso, J. Appl. Cryst.(1996) 29, 446-456
  • "Synchrotron radiation Multiple Diffraction Study of Al0.304Ga0.172In0.524As MOVPE grown onto InP(001)", J.M.Sasaki,L. P. Cardoso, C. Campos, K.J. Roberts, G. F. Clark, E. Pantos and M.A. Sacilotti , J. Crystal Growth (1997)172, 284-290
  • "Sensitivity of Bragg-Surface Diffraction to Analyze Ion-Implanted Semiconductors", M.A. Hayashi, S.L. Morelhão, L.H. Avanci, L. P. Cardoso, J.M. Sasaki, L.C. Kretly and S.L. Chang, Appl. Phys. Lett. (1997) 71(18), 2614-2616
  • "Difração múltipla de raios-X na observação do ordenamento na estrutura InGaP/GaAs(001)", M. A. Hayashi, L.P. Cardoso, J. Bettini and M.M.G. de Carvalho, Rev. Bras. Aplicações de Vácuo, (1997) 16(2), 17-19
  • "Observation of ordering in the InGaP/GaAs(001) structure by X-ray multiple diffraction"(portuguese), M. A. Hayashi,L. P. Cardoso, J. Bettini and M.M.G. de Carvalho, Rev. Bras. Aplicações de Vácuo, (1997) 16(2), 17-19
  • "Study of (La1-xCex)3Al unit cell variation by X-Ray Diffraction", L.P. Cardoso, M.A. Hayashi, A.N. Medina and F.G. Gandra, Rev. Bras. Aplicações de Vácuo (1998) 17(2), 32-34
  • "X-Ray Surface Waves at Large Angle Incidence Under Multi-Beam Excitation", C. Campos, N. L. Sanjurjo and S.L. Chang, Phys. Letters A 246:(5) 441-445 (1998)
  • "Mapping of Bragg-Surface Diffraction of InP/GaAs(100) Structure", L.H. Avanci, M.A. Hayashi, L. P. Cardoso, S.L. Morelhão, Ferenc Riesz, K. Rakennus and T. Hakkarainen, J. Crystal Growth (1998) 188, 220-224
  • "Study of Structural, Electrical and Magnetic Properties of the Kondo System (La1-xCex)3Al", A.N. Medina, M.A. Hayashi, L. P. Cardoso, S. Gama and F.G. Gandra, Phys. Rev. B(1998) 57(10), 5900-5905
  • "Observation of Coherent Hybrid Reflection with Synchrotron Radiation", S.L. Morelhão, L.H. Avanci, M.A. Hayashi,L. P. Cardoso, S.P. Collins, Appl. Phys. Lett. (1998) 73(15), 2194-2196
  • "Determination of the transition from Kondo to intermediate valence regime in (La1-xCe)Ni using ESR", A.N. Medina, F.G. Gandra, W.R. Azanha and L. P. Cardoso, J. Phys.:Cond. Matter (1998) 10(43) 9763-9768
  • "Piezoelectric Coefficients of mNA Organic Nonlinear Optical Material Using Synchrotron Radiation X-ray Multiple Diffraction", L.H. Avanci, L.P. Cardoso, S. E. Girdwood, D. Pugh, J.N. Sherwood and K.J. Roberts, Phys. Rev. Lett. (1998) 81(24), 5426-5429
  • "Study of the Sol-Gel Processing of Glass-Ceramic Powders in the SiO2-Al2O3-CaO-CaF2 System. Part 2: Microstructure Evaluation"M.S. Zolotar, C.A.C. Zavaglia, L.P. Cardoso and J.A. Fraymann, Bioceramics, vol. II, ed. R.Z. LeGeros and J.P. LeGeros, World Scient. (1998) 137-140
  • "High Resolution Synchrotron Radiation Renninger Scan of InGaP/GaAs(001)", M.A. Hayashi, L.H. Avanci, L.P. Cardoso, J. Bettini, M.M.G. de Carvalho, S.L. Morelhão and S.P. Collins, J. Synchrotron Rad. (1999) 6, 29-33
  • "Change of the Kondo regime in CePd2Al3 induced by chemical substitution: verification of the Doniach diagram", A.N. Medina, D.P. Rojas, F.G. Gandra, W.R. Azanha and L.P. Cardoso, Phys. Rev. B (1999) 59(13), 8738-8744
  • "Electrical Field Effects on Crystalline Perfection of MBA-NP Crystals by Mapping of Bragg-Surface Diffraction", S.L. Morelhão, L.H. Avanci, M.A. Hayashi and L.P. Cardoso, Mat. Res. Soc. Symp. Proc. (1999) vol. 561, 87-92
  • "Evidences of Be3P2 formation during growth of Be doped Phosphorous III-V semiconductor compounds", M.M.G. de Carvalho, J. Bettini, M.A.A. Pudenzi, L.P. Cardoso and M.A. Cotta, Appl. Phys. Lett.(1999) 74(24), 3669-3671
  • "Analysis of Be-doping of InGaP lattice matched to GaAs", J. Bettini, M.M.G. de Carvalho, N.C. Frateschi, A. Silva Filho, L.P. Cardoso and R. Landers, J. Crystal Growth (2000) 208, 65-72
  • "Hysteresis-like Behaviour in Meta-Nitroaniline (mNA) Crystals", L.H. Avanci, R.S. Braga, L.P. Cardoso, D.S. Galvão and J.N. Sherwood, Phys. Rev. Lett. (1999) 83(24), 5146-5149
  • "Synchrotron Radiation X-ray Multiple Diffraction applied to the Study of Electric Field Induced Strain in MBANP Organic Non-linear Optical Material", L.H. Avanci, L.P. Cardoso, S.E. Girdwood, D. Pugh, K.J. Roberts, J.M. Sasaki and J.N. Sherwood, Phys. Rev. B (2000) 61(10), 6507-6514
  • ”Magnetic phase diagram of U(Ga,Cu)2, F.G. Gandra, D.P. Rojas, L. Shlyk, L.P.Cardoso andA.N.Medina,  J. Mag. Magn. Materials (2001) 226-230, 1340-1342
  • "Transport and thermodynamic properties of YbInNi4-xCux system”, D.P. Rojas, A.N.Medina, F.G. Gandra andL.P.Cardoso,  J. Mag. Magn. Materials (2001) 226-230, 73-75
  • "Crystallinity changes evidence in modified and dyed Poly(ethylene terephtalate) films monitored by photothermal method", L. Olenka, É. N. da Silva, W.L.F. dos Santos, A.R. Rubira, A. N. Medina, L.P. Cardoso, M.L. Baesso, L.C. M. Miranda and A. C. Bento, Analytical Sciences (2001) 17, s387-s389
  • “Unusual behavior of the Yb hybridization in La1-xYbxCu3Al2”, D.P. Rojas, A.N. Medina, L.P. Cardoso, A.A. Coelho and F.G. Gandra, Phys. Rev. B (2001) 63 (16), 165114
  • “Evaluation of the thermophysical properties of modified and dyed poly(ethylene terephthalate) films", L. Olenka, E.N. da Silva, W.L.F. Santos, E.C. Muniz, A. F. Rubira, L.P. Cardoso, A.N. Medina, L.C.M. Miranda, M.L. Baesso and A. C.  Bento,  J. Physics D-Applied Physics (2001)  34 (15) 2248-2254
  • "Structural Characterization of TiNxOy/TiO2 Single Crystalline and Nanometric Multilayers Grown by LP-MOCVD on (110)TiO2", F. Fabreguette, L. Imhoff, L.P. Cardoso, R. Marcon, M.C.  Marco de Lucas, P. Sibillot, S. Bourgeois, P. Dufour and M. Sacilotti, Thin Solid Films (2001) 400, 125-129
  • "Rochelle Salt Piezoelectric Coefficients Obtained by X-ray Multiple Diffraction", A.O.dos Santos, W.H. Yaegashi, R. Marcon, B.B. Li, R.V. Gelamo, L.P. Cardoso, J.M. Sasaki, M.A.R. Miranda and F. E. A. Melo, J. Phys: Cond. Matter (2001) 13, 10497-1050
  • “Synchrotron Radiation x-Ray Multiple Diffraction in the Study of the KDP Phase Transition Induced by Electric Field”, A.O. dos Santos, R.V. Gelamo, L. P. Cardoso, M. A. R. Miranda, M. A.M. Nogueira, C. M. R. Remédios, F.E.A. Melo, J.M. Sasaki, L.H. Avanci and S.L. Morelhão, Materials Research (2001), 4 (1), 1-6
  • "Crystallization of Amorphous GaAs Films Prepared onto Different Substrates", R. Campomanes, J.H. Dias da Silva, J. Vilcarromero and L.P. Cardoso, J. Non-Crystalline Solids (2002) 299-302, 788-792
  • "Magnetic Properties of U(Ga1-xMx)2 , M=Cu,Ge and Al", L.M. da Silva, F.G. Gandra, D.P. Rojas, L.P. Cardosoand  A.N. Medina, Physica B (2002) 312-313, 906-908
  • "Influence of Austenite Grain Size on Mechanical Properties of Stainless Shape Memory Alloy", J. Otubo, F.C. Nascimento, P.R. Mei, L.P. Cardoso and M.J. Kaufman, Mat. Transactions, (2002)  43 (5), 916-919
  • Purification and Growth of PbI2 Crystals. Dependence of the Radiation Response on the PbICrystal Purity", I.B. Oliveira, F.E. Costa, M. J. Armelin, L.P. Cardoso and M.M. Hamada, IEEE Trans. Nuc. Science (2002)  49(4), 1968-1973
  • "Structural Characterization of TiO2/TiNO(d-doping) Heterostructures on TiO2(110) Substrates", T. Chiaramonte, L.P. Cardoso, R.V. Gelamo, F. Fabreguette, M. Sacilotti, L. Imhoff, S. Bourgeois and M.C. Marco de Lucas, Appl. Surf. Sciences (2003) 212-213, 661-666
  • "Magnetic properties of U (Ge1-xNix)2 system", D.P. Rojas, A.N. Medina, F.G. Gandra, and L.P. Cardoso, J.Appl. Phys.(2003) 93, 7825-7827
  • "Spatial ordering in InP/InGaP nanostructures", J.R.R. Bortoleto, H.R. Gutiérrez, M.A. Cotta, J. Bettini, L.P. Cardosoand M.M.G. de Carvalho, Appl. Phys. Lett. (2003)  82, 3523-3525 [Selecionado para o Virtual Journal of Nanoscale Science & Technology, vol. 7, issue 21, May 2003]
  • "Habit Modification of nearly perfect single crystals of potassium dihydrogen phosphate (KDP) by trivalent manganeses ions studied using Synchrotron Radiation X-ray Multiple Diffraction in Renninger Scanning mode", L.H. Avanci, X. Lai, J.M. Sasaki, K.J. Roberts and L.P. Cardoso,  J. Appl. Cryst. (2003) 36, 1230-1235
  • "Piezoelectric Coefficients Of The L-arginine Hydrochloride Monohydrate Obtained By X-ray Multiple Diffraction Using Synchrotron Radiation", J.M.A. Almeida, M.A.R. Miranda, C.M.R. Remédios,  F.E.A. Melo, P.T.C. Freire, J.M. Sasaki, L.P. Cardoso, A.O. dos Santos and S. Kycia,  J. Appl. Cryst. (2003) 36, 1348-1351
  • "Effect of Chemical Substitution on the  Magnetic Properties of U Ge2", D. Rojas, L.M. da Silva, L.P. Cardoso, A.N. Medina and F.G. Gandra,  aceito J.Magn. and Magnetic Materials  (2004)
  • "Magnetic properties of the U1−xLaxPd2Ga3 series of compounds", D.P. Rojas, L.M. da Silva, A.N. Medina, F.G. Gandra, L.P. Cardoso and J.C. Waerenborgh, J.Magn. and Magnetic Materials (2004) 272-276(Sup.1),E1-E3
  • "X-ray Multiple Diffraction as a Probe to Determine all  Piezoelectric Coefficients of a Crystal: Rochelle Salt Case", A. O. dos Santos and L.P. Cardoso, J.M. Sasaki,  M.A.R. Miranda and F. E. A. Melo,  J. Phys: Cond. Matter. (2003)15(46), 7835-784
  • "Synchrotron Radiation Multiple Diffraction in the Characterization of the PrAl2 magnetocaloric compound", A. O. dos Santos, J.C.P. Campoy, A. A. Coelho, S. Gama and L.P. Cardoso, J.Magn. and Magnetic Materials (2004) 272-276 (3), 2154-2156
  • "IonRock: software for solving strain gradients of ion-implanted semiconductors by X-ray diffraction measurements and evolutionary programming" L. Bleicher, JM Sasaki, RV Orloski, LP Cardoso, MA Hayashi and JW Swart, Computer Physics Communications, (2004) 160 (2),  158-165
  • “Hysteresislike behavior in MBANP Crystals", A. O. dos Santos, L.H. Avanci, L.P. Cardoso, D. Galvão, S. Legoas, J.N. Sherwood,  aceito Crystal Growth & Design (2004)
  • “X- Ray Multiple Diffraction on the the Shallow Junction of  B in Silicon”, R.V. Orloski, M.A.A. Pudenzi, M.A. Hayashi, J.W. Swart and L.P. Cardoso, aceito J. Mol.  Catal.  A – Chemical (2004)

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